Image: AFMimageRoughGlass20x20
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Description: Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). The AFM used was the Veeco di CP-II, scanned in contact mode. Constructed at the Nanorobotics Laboratory at Carnegie Mellon University (http://nanolab.me.cmu.edu).
Title: AFMimageRoughGlass20x20
Credit: AFMimageRoughGlass20x20.png
Author: AFMimageRoughGlass20x20.png: Chych derivative work: Materialscientist (talk)
Usage Terms: Public domain
License: Public domain
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